arXiv · 1803.02226
Epitaxial UN and $\alpha$-U$_2$N$_3$ Thin Films
Abstract
Single crystal epitaxial thin films of UN and U$_2$N$_3$ have been grown for the first time by reactive DC magnetron sputtering. These films provide ideal samples for fundamental research into the potential accident tolerant fuel, UN, and U$_2$N$_3$, its intermediate oxidation product. Films were characterised using x-ray diffraction (XRD) and x-ray photoelectron spectroscopy (XPS), with XRD analysis showing both thin films to be [001] oriented and composed of a single domain. The specular lattice parameters of the UN and U$_2$N$_3$ films were found to be 4.895\,\AA{} and 10.72\,\AA{}, respectively, with the UN film having a miscut of 2.6\,$^\circ$. XPS showed significant differences in the N-1s peak between the two films, with area analysis showing both films to be stoichiometric.
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E. Lawrence Bright, S. Rennie, M. Cattelan, N. A. Fox, D. T. Goddard, R. Springell. 2018-03-06. Epitaxial UN and $\alpha$-U$_2$N$_3$ Thin Films. https://arxiv.org/abs/1803.02226
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