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arXiv · 1803.09360

Stochastic Model of Breakdown Nucleation under Intense Electric Fields

Eliyahu Zvi Engelberg·Yinon Ashkenazy·Michael Assaf
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Abstract

Plastic response due to dislocation activity under intense electric fields is proposed as a source of breakdown. A model is formulated based on stochastic multiplication and arrest under the stress generated by the field. A critical transition in the dislocation population is suggested as the cause of protrusion formation leading to subsequent arcing. The model is studied using Monte Carlo simulations and theoretical analysis, yielding a simplified dependence of the breakdown rates on the electric field. These agree with experimental observations of field and temperature breakdown dependencies.

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Eliyahu Zvi Engelberg, Yinon Ashkenazy, Michael Assaf. 2018-03-25. Stochastic Model of Breakdown Nucleation under Intense Electric Fields. https://doi.org/10.1103/physrevlett.120.124801

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