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arXiv · 1804.07574

Redox reaction enhanced Schottky contact at a \LNO{}(001)/Al interface

Joseph Scola·Bruno Berini·Yves Dumont·Pavan Nukala·Brahim Dkhil
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Abstract

Emergent phenomena at interfaces between oxides and metals can appear due to charge transfer and mass transport that modify the bulk properties. By coating the metallic oxide LaNiO$_3$ by aluminium, we fabricated a junction exhibiting a diode-like behaviour. At the equilibrium, the interface is insulating. The metallic behaviour can be recovered by applying a voltage drop across the junction in one polarity only. The electrical properties in direct and reverse bias are investigated. The observed electro-resistive effect rises up to $10^5$ \% and can be interpreted in terms of (i) a spontaneous redox reaction occurring at the interface and (ii) its reversal induced by charge injection in direct bias.

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Joseph Scola, Bruno Berini, Yves Dumont, Pavan Nukala, Brahim Dkhil. 2018-04-20. Redox reaction enhanced Schottky contact at a \LNO{}(001)/Al interface. https://arxiv.org/abs/1804.07574

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