Benchmarks for Image Classification and Other High-dimensional Pattern Recognition Problems

Abstract

A good classification method should yield more accurate results than simple heuristics. But there are classification problems, especially high-dimensional ones like the ones based on image/video data, for which simple heuristics can work quite accurately; the structure of the data in such problems is easy to uncover without any sophisticated or computationally expensive method. On the other hand, some problems have a structure that can only be found with sophisticated pattern recognition methods. We are interested in quantifying the difficulty of a given high-dimensional pattern recognition problem. We consider the case where the patterns come from two pre-determined classes and where the objects are represented by points in a high-dimensional vector space. However, the framework we propose is extendable to an arbitrarily large number of classes. We propose classification benchmarks based on simple random projection heuristics. Our benchmarks are 2D curves parameterized by the classification error and computational cost of these simple heuristics. Each curve divides the plane into a "positive- gain" and a "negative-gain" region. The latter contains methods that are ill-suited for the given classification problem. The former is divided into two by the curve asymptote; methods that lie in the small region under the curve but right of the asymptote merely provide a computational gain but no structural advantage over the random heuristics. We prove that the curve asymptotes are optimal (i.e. at Bayes error) in some cases, and thus no sophisticated method can provide a structural advantage over the random heuristics. Such classification problems, an example of which we present in our numerical experiments, provide poor ground for testing new pattern classification methods.