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arXiv · 1808.00779

On a critical artifact in the quantum yield methodology

Bart van Dam·Benjamin Bruhn·Ivo Kondapaneni·Gejza Dohnal·Alexander Wilkie·Jaroslav Křivánek·Jan Valenta·Yvo Mudde·Peter Schall·Kateřina Dohnalová
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Abstract

For the development and optimization of novel light emitting materials, such as fluorescent proteins, dyes and semiconductor quantum dots (QDs), a reliable and robust analysis of the emission efficiency is crucial. The emission efficiency is typically quantified by the photoluminescence quantum yield (QY), defined by the ratio of emitted to absorbed photons. We show that this methodology suffers from a flaw that leads to underestimated QY values, presenting as a 'parasitic absorption'. This effect has not been described and/or corrected for in literature and is present already under common experimental conditions, therefore, it is highly relevant for a number of published studies. To correct for this effect, we propose a modification to the methodology and a correction procedure.

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Bart van Dam, Benjamin Bruhn, Ivo Kondapaneni, Gejza Dohnal, Alexander Wilkie, Jaroslav Křivánek, Jan Valenta, Yvo Mudde, Peter Schall, Kateřina Dohnalová. 2018-08-02. On a critical artifact in the quantum yield methodology. https://arxiv.org/abs/1808.00779

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