SearcharxivSearch

arXiv · 1810.06107

Approximate T-matrix and optical properties of spheroidal particles to third order in size parameter

Abstract

We here calculate the series expansion of the T-matrix for a spheroidal particle in the small-size/long-wavelength limit, up to third lowest order with respect to the size parameter, X, which we will define rigorously for a non-spherical particle. T is calculated from the standard extended boundary condition method with a linear system involving two infinite matrices P and Q, whose matrix elements are integrals on the particle surface. We show that the limiting form of the P- and Q-matrices, which is different in the special case of spheroid, ensures that this Taylor expansion can be obtained by considering only multipoles of order 3 or less (i.e. dipoles, quadrupoles, and octupoles). This allows us to obtain self-contained expressions for the Taylor expansion of T(X). The lowest order is O(X^3) and equivalent to the quasi-static limit or Rayleigh approximation. Expressions to order O(X^5) are obtained by Taylor expansion of the integrals in P and Q followed by matrix inversion. We then apply a radiative correction scheme, which makes the resulting expressions valid up to order O(X^6). Orientation-averaged extinction, scattering, and absorption cross-sections are then derived. All results are compared to the exact T-matrix predictions to confirm the validity of our expressions and assess their range of applicability. For a wavelength of 400nm, the new approximation remains valid (within 1% error) up to particle dimensions of the order of 100-200nm depending on the exact parameters (aspect ratio and material). These results provide a relatively simple and computationally-friendly alternative to the standard T-matrix method for spheroidal particles smaller than the wavelength, in a size range much larger than for the commonly-used Rayleigh approximation.

Explore related subjects

Keep this discovery

BibTeXRIS

Matt R. A. Majic, Luke Pratley, Dmitri Schebarchov, Walter R. C. Somerville, Baptiste Auguie, Eric C. Le Ru. 2018-10-14. Approximate T-matrix and optical properties of spheroidal particles to third order in size parameter. https://doi.org/10.1103/physreva.99.013853

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related papers

Two-step high-accuracy microwave frequency measurement and time-frequency analysis based on optical frequency combs

Broadband microwave frequency measurement and time-frequency analysis are crucial for applications such as electronic warfare. However, when it comes to ultra wideband signal analysis, traditional electronic methods have high analysis accuracy, but intrinsic electronic bottlenecks limit their real-time analysis. Here, we propose and experimentally demonstrate a two-step microwave frequency measurement and time-frequency analysis method based on optical frequency combs. The system first performs coarse frequency localization over the 0-40 GHz range using stimulated-Brillouin-scattering-assisted frequency-to-time mapping (FTTM) and dual-comb channelized reception. The dual-comb is then reapplied for downconverting the signal under test, followed by digital signal processing to achieve high-accuracy unambiguous frequency extraction. Experimental results show that the system achieves mean single-tone frequency measurement errors of less than 10 kHz over 0-40 GHz. We further experimentally measure multi-tone, linearly frequency-modulated, and V-shaped frequency-modulated signals, demonstrating the proposed method's capability for analyzing complex signals.

physics.optics

A Two-Mirror Faceted Projection System for EUV Lithography

We propose an all-reflective two-mirror projection system for extreme ultraviolet (EUV) lithography operating at exposure wavelengths of $13.5$~nm (Mo/Si) and $11.2$~nm (Ru/Be), delivering a fourfold ($4\times$) demagnification of the periodic mask pattern at a numerical aperture approaching unity ($\mathrm{NA}_{\max} \approx 0.993$). In contrast to conventional EUV projection objectives that incorporate 6--10 aspheric mirrors with an overall optical throughput of less than $15\%$, the proposed design redirects each accepted discrete spatial diffraction order scattered by the mask onto the wafer via a dedicated pair of planar mirror facets. The number of reflections is strictly fixed at two for all accepted orders, retaining $50$--$60\%$ of the power leaving the mask in each accepted order. We derive a spatial geometry providing rigorous optical path length equalization across all diffraction orders, thereby removing order-dependent propagation phase shifts. Individually optimized 30-bilayer Bragg multilayer coatings are designed for each facet using the transfer matrix method combined with global evolutionary optimization algorithms. The architecture is generalized to a three-dimensional vector formulation with a two-dimensionally periodic mask. Utilizing inverse lithography technology, Fourier parameterization, and a differentiable electromagnetic modal waveguide solver, we solve the synthesis problem for binary absorber masks (La absorber on a Ru/Be/Sr multilayer mirror). We demonstrate simulated aerial images of sub-10-nm features on the wafer (isolated peaks with a full width at half maximum (FWHM) of approximately $5.4$~nm and line pairs with a critical dimension of $6$~nm) and find that the two peaks remain resolved for the tested wafer defocus values from $0$ to $5$~nm along the $z$-axis.

physics.optics

Antimony for broadband nanophotonics across the ultraviolet, visible and infrared

Semimetal elemental antimony (Sb) nanostructures show great potential for applications where nanophotonic properties play a key role, such as phase-change optical memories, non-linear optical elements, photothermal therapy agents, photodetectors and photocatalysts. However, designing advanced Sb-based photonic devices critically requires an accurate and reliable knowledge of the optical response of bulk and nanoscale Sb. Herein, we report for the first time a fully consistent and accurately measured dielectric function for Sb nanoscale films in a wide spectral range from the ultraviolet to the far infrared (4 - 0.04 eV, i.e. ~ 0.3 - 30 $\mu$m), surpassing previous reports that explored a limited spectral range. It is found that the Sb spectral response is driven exclusively by giant interband transitions in the visible up to mid infrared (4 - 0.4 eV, i.e. ~ 0.3 - 3 $\mu$m), and that their contribution dominates over that of free carriers down to 0.12 eV (i.e. ~ 10 $\mu$m). Such spectral response enables Sb nanostructures to display spectrally selective and tunable nanophotonic resonances. First, we showcase interband plasmonic resonances in the visible-to-near infrared for Sb nanogratings. Second, we report giant refractive index dielectric resonances in the mid infrared for nanostructured Sb/dielectric/metal resonant cavities. These findings open a pathway to optimized planar Sb nanoscale designs enabling a tailored light-matter interaction, which will be useful for integrated data, telecom, medical, optoelectronic and energy conversion devices operating in a broad spectral range.

physics.optics