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arXiv · 1902.05576

Sub-micron spatial resolution in far-field Raman imaging via positivity constrained super-resolution

Abstract

Raman microscopy is a valuable tool for detecting physical and chemical properties of a sample material. When probing nanomaterials or nanocomposites the spatial resolution of Raman microscopy is not always adequate as it is limited by the optical diffraction limit. Numerical post-processing with super-resolution algorithms provides a means to enhance resolution and can be straightforwardly applied. The aim of this work is to present interior-point least squares (IPLS) as a powerful tool for super-resolution in Raman imaging through constrained optimisation. IPLS's potential for super-resolution is illustrated on numerically generated test images. Its resolving power is demonstrated on Raman spectroscopic data of a polymer nanowire sample. Comparison to AFM data of the same sample substantiates that the presented method is a promising technique for analysing nanomaterial samples.

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Dominik J. Winterauer, Daniel Funes-Hernando, Jean-Luc Duvail, Saïd Moussaoui, Tim Batten, Bernard Humbert. 2019-02-14. Sub-micron spatial resolution in far-field Raman imaging via positivity constrained super-resolution. https://arxiv.org/abs/1902.05576

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