arXiv · 1905.09653
New methods for SVM feature selection
Abstract
Support Vector Machines have been a popular topic for quite some time now, and as they develop, a need for new methods of feature selection arises. This work presents various approaches SVM feature selection developped using new tools such as entropy measurement and K-medoid clustering. The work focuses on the use of one-class SVM's for wafer testing, with a numerical implementation in R.
Explore related subjects
Keep this discovery
Tangui Aladjidi, François Pasqualini. 2019-05-23. New methods for SVM feature selection. https://arxiv.org/abs/1905.09653
Cite the original work for its findings. Save a collection to share your selection of sources.