arXiv · 2002.10339
Shot Noise of a Temperature-Biased Tunnel Junction
Abstract
We report the measurement of the current noise of a tunnel junction driven out-of-equilibrium by a temperature and/or voltage difference, i.e. the charge noise of heat and/or electrical current. This is achieved by a careful control of electron temperature below 1 K at the nanoscale, and a sensitive measurement of noise with wide bandwidth, from 0.1 to 1 GHz. An excellent agreement between experiment and theory with no fitting parameter is obtained. In particular, we find that the current noise of the junction of resistance R when one electrode is at temperature T and the other one at zero temperature is given by S = 2 ln2 kB T /R.
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Samuel Larocque, Edouard Pinsolle, Christian Lupien, Bertrand Reulet. 2020-02-24. Shot Noise of a Temperature-Biased Tunnel Junction. https://doi.org/10.1103/physrevlett.125.106801
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