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arXiv · 2003.03279

Addendum to `Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy'

Bart Platier·Ferdi van de Wetering·Mark van Ninhuijs·Seth Brussaard·Vadim Banine·Jom Luiten·Job Beckers
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Abstract

A new approach for an in-line beam monitor for ionizing radiation was introduced in a recent publication (Beckers, J., et al. "Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy." Journal of Physics D: Applied Physics 52.3 (2018): 034004.). Due to the recent detection and investigation of an additional third decay regime of the afterglow of an extreme ultraviolet photon-induced plasma described in a later article (Platier, B., et al. "Transition from ambipolar to free diffusion in an EUV-induced argon plasma." Applied Physics Letters 116.10 (2020).) there is an additional reason for a minimum number of photons for this approach to work. Near or below this threshold, we explain that the response time of the diagnostic method is a limiting factor. Further, a second limit for the number of photons within a pulse is formalized related to the trapping of highly energetic free electrons.

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Bart Platier, Ferdi van de Wetering, Mark van Ninhuijs, Seth Brussaard, Vadim Banine, Jom Luiten, Job Beckers. 2020-03-06. Addendum to `Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy'. https://doi.org/10.1088/1361-6463/ab8f53

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