arXiv · 2008.12768
Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone
Abstract
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a non-crystalline medium from scanning diffraction measurements, and recover the illumination aberrations. Our method will enable 3D imaging and materials characterization at high resolution for a wide range of materials.
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Philipp M Pelz, Hamish G Brown, Jim Ciston, Scott D Findlay, Yaqian Zhang, Mary Scott, Colin Ophus. 2020-08-28. Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone. https://doi.org/10.1103/physrevresearch.3.023159
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