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arXiv · 2107.06066

Defect detection and NDE of low-modulus PMMA material using mechanical loading and WFT analysis

Jitendra Dhanotia·Amit Chatterjee·Vimal Bhatia·Shashi Prakash
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Abstract

In present communication, we report our investigations undertaken towards detection of defects and non-destructive evaluation of low-modulus sample of Poly Methyl Metha Acrylate (PMMA) material using phase measuring deflectometry and windowed Fourier transform (WFT). The slope of the phase provides the information regarding defects and surface variation of the object. Experimental results conclusively establish the viability of the technique.

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Jitendra Dhanotia, Amit Chatterjee, Vimal Bhatia, Shashi Prakash. 2021-06-16. Defect detection and NDE of low-modulus PMMA material using mechanical loading and WFT analysis. https://arxiv.org/abs/2107.06066

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