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arXiv · 2108.07176

Method for Identifying Crystalline Phases in X-ray Diffraction Data from Multiphase Samples

A. D. Skorbun·S. V. Gabielkov·I. V. Zhyganiuk
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Abstract

A new method for identifying crystalline phases in X-ray diffraction data has been proposed, which is especially useful for the study of multiphase materials (more than eight - ten phases) with a relatively low content (less than 1 - 3 wt\%). The method is based on a statistical analysis of data and provides an unambiguous non-quantitative criterion for the presence of one or another phase in the material. It has been shown that the method works reliably in cases where a significant number of reflexes (more than several dozen) on the diffraction pattern are comparable with intensity-to-noise ratio.

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A. D. Skorbun, S. V. Gabielkov, I. V. Zhyganiuk. 2021-08-06. Method for Identifying Crystalline Phases in X-ray Diffraction Data from Multiphase Samples. https://arxiv.org/abs/2108.07176

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