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arXiv · 2109.14772

An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics

Matthew Olszta·Derek Hopkins·Kevin R. Fiedler·Marjolein Oostrom·Sarah Akers·Steven R. Spurgeon
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Abstract

Artificial intelligence (AI) promises to reshape scientific inquiry and enable breakthrough discoveries in areas such as energy storage, quantum computing, and biomedicine. Scanning transmission electron microscopy (STEM), a cornerstone of the study of chemical and materials systems, stands to benefit greatly from AI-driven automation. However, present barriers to low-level instrument control, as well as generalizable and interpretable feature detection, make truly automated microscopy impractical. Here, we discuss the design of a closed-loop instrument control platform guided by emerging sparse data analytics. We demonstrate how a centralized controller, informed by machine learning combining limited $a$ $priori$ knowledge and task-based discrimination, can drive on-the-fly experimental decision-making. This platform unlocks practical, automated analysis of a variety of material features, enabling new high-throughput and statistical studies.

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Matthew Olszta, Derek Hopkins, Kevin R. Fiedler, Marjolein Oostrom, Sarah Akers, Steven R. Spurgeon. 2021-09-30. An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics. https://doi.org/10.1017/s1431927622012065

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