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arXiv · 2202.07837

Application of Long Short-Term Memory Recurrent Neural Networks Based on the BAT-MCS for Binary-State Network Approximated Time-Dependent Reliability Problems

Wei-Chang Yeh
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Abstract

Reliability is an important tool for evaluating the performance of modern networks. Currently, it is NP-hard and #P-hard to calculate the exact reliability of a binary-state network when the reliability of each component is assumed to be fixed. However, this assumption is unrealistic because the reliability of each component always varies with time. To meet this practical requirement, we propose a new algorithm called the LSTM-BAT-MCS, based on long short-term memory (LSTM), the Monte Carlo simulation (MCS), and the binary-adaption-tree algorithm (BAT). The superiority of the proposed LSTM-BAT-MCS was demonstrated by experimental results of three benchmark networks with at most 10-4 mean square error.

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Wei-Chang Yeh. 2022-02-16. Application of Long Short-Term Memory Recurrent Neural Networks Based on the BAT-MCS for Binary-State Network Approximated Time-Dependent Reliability Problems. https://arxiv.org/abs/2202.07837

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