arXiv · 2203.03429
Synthetic Defect Generation for Display Front-of-Screen Quality Inspection: A Survey
Abstract
Display front-of-screen (FOS) quality inspection is essential for the mass production of displays in the manufacturing process. However, the severe imbalanced data, especially the limited number of defect samples, has been a long-standing problem that hinders the successful application of deep learning algorithms. Synthetic defect data generation can help address this issue. This paper reviews the state-of-the-art synthetic data generation methods and the evaluation metrics that can potentially be applied to display FOS quality inspection tasks.
Explore related subjects
Keep this discovery
Shancong Mou, Meng Cao, Zhendong Hong, Ping Huang, Jiulong Shan, Jianjun Shi. 2022-03-03. Synthetic Defect Generation for Display Front-of-Screen Quality Inspection: A Survey. https://arxiv.org/abs/2203.03429
Cite the original work for its findings. Save a collection to share your selection of sources.