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arXiv · 2207.11364

Cryogenic ion trap system for high-fidelity near-field microwave-driven quantum logic

M. A. Weber·C. Löschnauer·J. Wolf·M. F. Gely·R. K. Hanley·J. F. Goodwin·C. J. Ballance·T. P. Harty·D. M. Lucas
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Abstract

We report the design, fabrication, and characterization of a cryogenic ion trap system for the implementation of quantum logic driven by near-field microwaves. The trap incorporates an on-chip microwave resonator with an electrode geometry designed to null the microwave field component that couples directly to the qubit, while giving a large field gradient for driving entangling logic gates. We map the microwave field using a single $^{43}$Ca$^+$ ion, and measure the ion trapping lifetime and motional mode heating rates for one and two ions.

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M. A. Weber, C. Löschnauer, J. Wolf, M. F. Gely, R. K. Hanley, J. F. Goodwin, C. J. Ballance, T. P. Harty, D. M. Lucas. 2022-07-22. Cryogenic ion trap system for high-fidelity near-field microwave-driven quantum logic. https://doi.org/10.1088/2058-9565%2Facfba8

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