arXiv · 2208.05847
Entanglement-Enhanced Quantum Metrology in Colored Noise by Quantum Zeno Effect
Abstract
In open quantum systems, the precision of metrology inevitably suffers from the noise. {In Markovian open quantum dynamics, the precision can not be improved by using entangled probes although the measurement time is effectively shortened.} However, it was predicted over one decade ago that in a non-Markovian one, the error can be significantly reduced by the quantum Zeno effect (QZE) [Chin, Huelga, and Plenio, Phys. Rev. Lett. \textbf{109}, 233601 (2012)]. In this work, we apply a recently-developed quantum simulation approach to experimentally verify that entangled probes can improve the precision of metrology by the QZE. Up to $n=7$ qubits, we demonstrate that the precision has been improved by a factor of $n^{1/4}$, which is consistent with the theoretical prediction. Our quantum simulation approach may provide an intriguing platform for experimental verification of various quantum metrology schemes.
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Xinyue Long, Wan-Ting He, Na-Na Zhang, Kai Tang, Zidong Lin, Hongfeng Liu, Xinfang Nie, Guanru Feng, Jun Li, Tao Xin, Qing Ai, Dawei Lu. 2022-08-11. Entanglement-Enhanced Quantum Metrology in Colored Noise by Quantum Zeno Effect. https://doi.org/10.1103/physrevlett.129.070502
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