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arXiv · 2210.12636

Multislice Electron Tomography using 4D-STEM

Juhyeok Lee·Moosung Lee·YongKeun Park·Colin Ophus·Yongsoo Yang
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Abstract

Electron tomography offers important three-dimensional (3D) structural information which cannot be observed by two-dimensional imaging. By combining annular dark field scanning transmission electron microscopy (ADF-STEM) with aberration correction, the resolution of electron tomography has reached atomic resolution. However, tomography based on ADF-STEM inherently suffers from several issues, including a high electron dose requirement, poor contrast for light elements, and artifacts from image contrast nonlinearity. Here, we developed a new method called MultiSlice Electron Tomography (MSET) based on 4D-STEM tilt series. Our simulations show that multislice-based 3D reconstruction can effectively reduce undesirable reconstruction artifacts from the nonlinear contrast, allowing precise determination of atomic structures with improved sensitivity for low-Z elements, at considerably low electron dose conditions. We expect that the MSET method can be applied to a wide variety of materials, including radiation-sensitive samples and materials containing light elements whose 3D atomic structures have never been fully elucidated due to electron dose limitations or nonlinear imaging contrast.

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Juhyeok Lee, Moosung Lee, YongKeun Park, Colin Ophus, Yongsoo Yang. 2022-10-23. Multislice Electron Tomography using 4D-STEM. https://doi.org/10.1103/physrevapplied.19.054062

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