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arXiv · 2301.03657

Monolithically Integrated Wavelength-meter in InP with measurement bandwidth of 100nm centered on the C band

Andrea Volpini·Damiano Massella·David Alvarez-Outerelo·Francisco Soares·Francisco J. Diaz-Otero
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Abstract

In this paper we will explore the creation of a monolithically integrated wavelength meter in InP. This type of devices are a key requirement for many applications and it is especially important to have them integrated with active components like lasers and gain sections. We present a wavelength meter based on multiple ring resonators that has been realized in a commercial MPW run and tested using a tunable laser. The designed circuit is theoretically capable of resolution down to 1.6pm and a measurement speed down to 500ps within a wavelength range of 100nm.

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Andrea Volpini, Damiano Massella, David Alvarez-Outerelo, Francisco Soares, Francisco J. Diaz-Otero. 2023-01-09. Monolithically Integrated Wavelength-meter in InP with measurement bandwidth of 100nm centered on the C band. https://arxiv.org/abs/2301.03657

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