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arXiv · 2304.05948

Femtosecond reduction of atomic scattering factors triggered by intense x-ray pulse

Ichiro Inoue·Jumpei Yamada·Konrad J. Kapcia·Michal Stransky·Victor Tkachenko·Zoltan Jurek·Takato Inoue·Taito Osaka·Yuichi Inubushi·Atsuki Ito·Yuto Tanaka·Satoshi Matsuyama·Kazuto Yamauchi·Makina Yabashi·Beata Ziaja
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Abstract

X-ray diffraction of silicon irradiated with tightly focused femtosecond x-ray pulses (photon energy: 11.5 keV, pulse duration: 6 fs) was measured at various x-ray intensities up to $4.6\times10^{19}$ W/cm$^2$. The measurement reveals that the diffraction intensity is highly suppressed when the x-ray intensity reaches of the order of $10^{19}$ W/cm$^2$. With a dedicated simulation, we confirm the observed reduction of the diffraction intensity is attributed to the femtosecond change in individual atomic scattering factors due to the ultrafast creation of highly ionized atoms through photoionization, Auger decay, and subsequent collisional ionization. We anticipate that this ultrafast reduction of atomic scattering factor will be a basis for new x-ray nonlinear techniques, such as pulse shortening and contrast variation x-ray scattering.

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Ichiro Inoue, Jumpei Yamada, Konrad J. Kapcia, Michal Stransky, Victor Tkachenko, Zoltan Jurek, Takato Inoue, Taito Osaka, Yuichi Inubushi, Atsuki Ito, Yuto Tanaka, Satoshi Matsuyama, Kazuto Yamauchi, Makina Yabashi, Beata Ziaja. 2023-04-12. Femtosecond reduction of atomic scattering factors triggered by intense x-ray pulse. https://doi.org/10.1103/physrevlett.131.163201

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