arXiv · 2310.04624
Transport Study of Charge Carrier Scattering in Monolayer WSe$_2$
Abstract
Employing flux-grown single crystal WSe$_2$, we report charge carrier scattering behaviors measured in $h$-BN encapsulated monolayer field effect transistors. We perform quantum transport measurements across various hole densities and temperatures and observe a non-monotonic change of transport mobility $\mu$ as a function of hole density in the degenerately doped sample. This unusual behavior can be explained by energy dependent scattering amplitude of strong defects calculated using the T-matrix approximation. Utilizing long mean-free path ($>$500 nm), we demonstrate the high quality of our electronic devices by showing quantized conductance steps from an electrostatically-defined quantum point contact. Our results show the potential for creating ultra-high quality quantum optoelectronic devices based on atomically thin semiconductors.
Explore related subjects
Keep this discovery
Andrew Y. Joe, Kateryna Pistunova, Kristen Kaasbjerg, Ke Wang, Bumho Kim, Daniel A. Rhodes, Takashi Taniguchi, Kenji Watanabe, James Hone, Tony Low, Luis A. Jauregui, Philip Kim. 2023-10-06. Transport Study of Charge Carrier Scattering in Monolayer WSe$_2$. https://arxiv.org/abs/2310.04624
Cite the original work for its findings. Save a collection to share your selection of sources.