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arXiv · 2401.12651

Brillouin nonlinearity characterizations of a high refractive index silicon oxynitride platform

Kaixuan Ye·Akshay Keloth·Yvan Klaver·Alessio Baldazzi·Gioele Piccoli·Matteo Sanna·Lorenzo Pavesi·Mher Ghulinyan·David Marpaung
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Abstract

Silicon oxynitride (SiON) is a low-loss and versatile material for linear and nonlinear photonics applications. Controlling the oxygen-to-nitrogen (O/N) ratio in SiON provides an effective way to engineer its optical and mechanical properties, making it a great platform for the investigation of on-chip optomechanical interactions, especially the stimulated Brillouin scattering (SBS). Here we report the Brillouin nonlinearity characterization of a SiON platform with a specific O/N ratio (characterized by a refractive index of $n=1.65$). First, we introduce this particular SiON platform with fabrication details. Subsequently, we discuss various techniques for the on-chip Brillouin nonlinearity characterizations. In particular, we focus on the intensity-modulated pump-probe lock-in amplifier technique, which enables ultra-sensitive characterization. Finally, we analyze the Brillouin nonlinearities of this SiON platform and compare them with other SiON platforms. This work underscores the potential of SiON for on-chip Brillouin-based applications. Moreover, it paves the way for Brillouin nonlinearity characterization across various material platforms.

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Kaixuan Ye, Akshay Keloth, Yvan Klaver, Alessio Baldazzi, Gioele Piccoli, Matteo Sanna, Lorenzo Pavesi, Mher Ghulinyan, David Marpaung. 2024-01-23. Brillouin nonlinearity characterizations of a high refractive index silicon oxynitride platform. https://arxiv.org/abs/2401.12651

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