Effective medium theory for the electrical conductance of random resistor networks which mimic crack-template-based transparent conductive films

Yuri Yu. Tarasevich; Irina V. Vodolazskaya; Andrei V. Eserkepov; Fábio D. A. Aarão Reis

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arXiv · 2403.10241

Effective medium theory for the electrical conductance of random resistor networks which mimic crack-template-based transparent conductive films

Yuri Yu. Tarasevich·Irina V. Vodolazskaya·Andrei V. Eserkepov·Fábio D. A. Aarão Reis

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Abstract

We studied random resistor networks produced with regular structure and random distribution of edge conductances. These networks are intended to mimic crack-template-based transparent conductive films as well some random networks produced using nano-imprinting technology. Applying an effective medium theory, we found out that the electrical conductance of such networks is $\approx 0.5852 \sqrt{n_E}$, where $n_E$ is the number density of conductive edges. This dependence is in agreement with numerical calculations in Voronoi networks, although the effective conductances are approximately 15\% larger.

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Yuri Yu. Tarasevich, Irina V. Vodolazskaya, Andrei V. Eserkepov, Fábio D. A. Aarão Reis. 2024-03-15. Effective medium theory for the electrical conductance of random resistor networks which mimic crack-template-based transparent conductive films. https://arxiv.org/abs/2403.10241

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