SearcharxivSearch

arXiv · 2407.05799

Fabrication of n+ contact on p-type high pure Ge by cathodic electrodeposition of Li and impedance analysis of n+/p diode at low temperatures

Abstract

Fabrication of diode by forming n-type electrical contact on germanium (Ge) and its AC impedance analysis is important for radiation detection in the form of pulses. In this work lithium (Li) metal has been electro-deposited on p-type Ge single crystal from molten lithium nitrate at 260{\deg}C. The depth of Li diffusion in Ge was successfully varied by changing the electroplating time as determined by sheet resistance (SR) measurement after successive lapping of Ge surface. Li is found to diffuse up to 500 micron inside Ge by heat treatment of as deposited Li/Ge at 350{\deg}C for 1 hour. A stable n-type electrical contact on Ge with SR ~1 ohm/square and impurity concentration ~3.7x10^15/cm^3 is developed by Li incorporation in p-type Ge crystal showing net carrier concentration ~3.4x10^10/cm^3 and SR ~100 Kohm/square. Acceptor concentration determined from the 1/C^2 vs V plot shows similar temperature dependence as found by Hall measurement. The fabricated n+/p junction exhibit ideal diode characteristics with gradual increase in cut off voltage at low temperatures. Under forward bias, junction capacitance mainly comprises of diffusion capacitance (~10 micro.F) showing strong frequency dependence and the impedance is partly resistive resulting in semicircular Cole-Cole plot. Imaginary impedance spectra reveal that the relaxation time for the diffusion of majority carriers decreases at higher temperatures and increased forward voltages. The diode is purely capacitive under reverse bias showing a line parallel to the y-axis in the Cole-Cole plot with frequency independent (100Hz-100MHz) depletion capacitance ~10pF.

Explore related subjects

Keep this discovery

BibTeXRIS

Manoranjan Ghosh, Pravahan Salunke, Shreyas Pitale, S. G. Singh, G. D. Patra, Shashwati Sen. 2024-07-08. Fabrication of n+ contact on p-type high pure Ge by cathodic electrodeposition of Li and impedance analysis of n+/p diode at low temperatures. https://arxiv.org/abs/2407.05799

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related papers

Janus Dipoles: Fundamentals, Realizations, and Emerging Applications

The Janus dipole - featuring orthogonally oriented electric and magnetic dipoles with a 90-degree phase difference - has emerged as a powerful paradigm for wave manipulation. Unlike traditional Huygens dipoles used for directional control, this unique configuration exhibits strongly asymmetric, face-selective near-field behavior while maintaining a quasi-isotropic far-field radiation pattern. These remarkable properties make the Janus dipole an essential platform for directional wave shaping, with wide-ranging applications in on-chip photonics, quantum interactions, and wireless power transfer. This review systematically traces the rapid development of the Janus dipole from its foundational theoretical inception to its diverse implementation platforms across optical, microwave, and acoustic frequencies. In this paper, we explore the governing principles, classify realization strategies into passive Janus dipoles, active Janus dipoles, and advanced near-field coupling control, and highlight emerging frontiers. By bridging foundational electrodynamics with advanced device engineering, this paper serves as an essential reference and roadmap for researchers designing next-generation, highly integrated, and compact wave-manipulation systems.

physics.app-ph

Scattering-robust Imaging of Azimuthal Features with Enhanced Resolution

Imaging through scattering media remains a long-standing challenge in numerous real-world applications, ranging from medical imaging to long-distance sensing. Recently, illumination consisting of a single orbital angular momentum (OAM) mode, which is structured in the azimuthal coordinate, has been shown to provide enhanced resolution for imaging objects with azimuthal features, with the resolution becoming maximum at an optimal OAM value. However, in the presence of scattering, single-mode fields, which are spatially fully coherent, cause the imaging resolution to decrease significantly due to speckle formation. In this work, we employ azimuthally partially coherent fields and experimentally demonstrate imaging of azimuthal features with enhanced resolution in the presence of scattering. We show that lower degree of azimuthal coherence in such illumination leads to increased robustness against scattering while the azimuthal structure of the illumination ensures enhanced resolution. We derive the condition for best imaging resolution, and we report increase of imaging contrast in scattering from about 7% to 50% as the illumination is changed from a single-mode fully coherent field to that of an azimuthal partially coherent field.

physics.app-ph

Influence of magnetic fields on the performance of spin-orbit torque magnetic random-access memory

Spin-orbit torque magnetic random-access memory (SOT-MRAM) offers high speed, ultrahigh endurance, and compatibility with advanced semiconductor processes, making it a promising candidate for next-generation nonvolatile memory. However, intrinsic bias fields in magnetic tunnel junctions (MTJs), originating from reference-layer stray fields and interlayer coupling, cause asymmetric critical switching currents and increased energy consumption. Existing compensation approaches usually introduce additional magnetic layers into the MTJ stack, which increases fabrication complexity and limits wafer-scale integration. Here, we propose a bias-compensation strategy without modifying the MTJ stack by engineering local stray magnetic fields through magnetic filling materials in vertical interconnect access (VIA) channels during the back-end-of-line process. Micromagnetic simulations show that the proposed magnetic filling layer can provide the required auxiliary field for deterministic switching and significantly suppress write-current asymmetry. By optimizing the MTJ position relative to the magnetic filling structure, the write-current bias ratio is reduced from 21.6% in the conventional design to 1.3%. The approach is also applicable to in-plane magnetic anisotropy SOT-MTJs, reducing the bias ratio from 19.8% to -0.2%. Scaling analysis further demonstrates that the compensation effect remains effective when the device size is reduced to 20% of the original dimension (MTJ diameter approximately 10 nm), indicating its potential for high-density SOT-MRAM integration.

physics.app-ph