arXiv · 2407.13826
Designing fault-tolerant circuits using detector error models
Abstract
Quantum error-correcting codes, such as subspace, subsystem, and Floquet codes, are typically constructed within the stabilizer formalism, which does not fully capture the idea of fault-tolerance needed for practical quantum computing applications. In this work, we explore the remarkably powerful formalism of detector error models, which fully captures fault-tolerance at the circuit level. We introduce the detector error model formalism in a pedagogical manner and provide several examples. Additionally, we apply the formalism to three different levels of abstraction in the engineering cycle of fault-tolerant circuit designs: finding robust syndrome extraction circuits, identifying efficient measurement schedules, and constructing fault-tolerant procedures. We enhance the surface code's resistance to measurement errors, devise short measurement schedules for color codes, and implement a more efficient fault-tolerant method for measuring logical operators.
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Peter-Jan H. S. Derks, Alex Townsend-Teague, Ansgar G. Burchards, Jens Eisert. 2024-07-18. Designing fault-tolerant circuits using detector error models. https://doi.org/10.22331/q-2025-11-06-1905
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