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arXiv · 2411.05984

Corner cutting connects chiral colorimetry to net electric flux in lossless all-dielectric metasurfaces

Zaid Haddadin·Anna My Nguyen·Lisa V. Poulikakos
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Abstract

All-dielectric metasurfaces can produce structural colors, but the most advantageous design criteria are still being investigated. This work numerically studies how the two-dimensional shape of nanoparticles affects the colorimetric response under circularly polarized light (CPL) to develop a sensor distinguishing CPL orientations. Using lossless dielectric materials (silicon nitride on silicon dioxide), we achieve far-field dichroism by modifying oblong nanoparticles into L-shaped structures through corner cuts. This design suppresses one electric dipole under CPL illumination, leading to differential colorimetric responses. We link these responses to a decoupling effect in the near-field net electric flux. Our findings provide design guidelines for all-dielectric, lossless colorimetric sensors of chiral light.

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Zaid Haddadin, Anna My Nguyen, Lisa V. Poulikakos. 2024-11-08. Corner cutting connects chiral colorimetry to net electric flux in lossless all-dielectric metasurfaces. https://doi.org/10.1364/oe.545515

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