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arXiv · 2411.06668

Ab initio investigation of layered TMGeTe3 alloys for phase-change applications

Yihui Jiang·Suyang Sun·Hanyi Zhang·Xiaozhe Wang·Yibo Lei·Riccardo Mazzarello·Wei Zhang
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Abstract

Chalcogenide phase-change materials (PCMs) are one of the most mature candidates for next-generation memory technology. Recently, CrGeTe3 (CrGT) emerged as a promising PCM due to its enhanced amorphous stability and fast crystallization for embedded memory applications. The amorphous stability of CrGT was attributed to the complex layered structure of the crystalline motifs needed to initiate crystallization. A subsequent computational screening work identified several similar compounds with good thermal stability, such as InGeTe3, CrSiTe3 and BiSiTe3. Here, we explore substitution of Cr in CrGT with other 3d metals, and predict four additional layered alloys to be dynamically stable, namely, ScGeTe3, TiGeTe3, ZnGeTe3 and MnGeTe3. Thorough ab initio simulations performed on both crystalline and amorphous models of these materials indicate the former three alloys to be potential PCMs with sizable resistance contrast. Furthermore, we find that crystalline MnGeTe3 exhibits ferromagnetic behavior, whereas the amorphous state probably forms a spin-glass phase. This makes MnGeTe3 a promising candidate for magnetic phase-change applications.

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Yihui Jiang, Suyang Sun, Hanyi Zhang, Xiaozhe Wang, Yibo Lei, Riccardo Mazzarello, Wei Zhang. 2024-11-11. Ab initio investigation of layered TMGeTe3 alloys for phase-change applications. https://arxiv.org/abs/2411.06668

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