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arXiv · 2411.12823

Evaluation of Analytical Models in Scattering Scanning Near-field Optical Microscopy for High Spatial Resolution Spectroscopy

Soheil Khajavi·Ali Eghrari·Zahra Shaterzadeh-Yazdi·Mohammad Neshat
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Abstract

Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This paper studies two analytical models for the s-SNOM probe using atomic force microscopy (AFM) tip and its interaction with a dielectric material. We evaluate the validity of these models by retrieving the permittivity spectrum of a sample material through an inverse method.

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Soheil Khajavi, Ali Eghrari, Zahra Shaterzadeh-Yazdi, Mohammad Neshat. 2024-11-19. Evaluation of Analytical Models in Scattering Scanning Near-field Optical Microscopy for High Spatial Resolution Spectroscopy. https://arxiv.org/abs/2411.12823

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