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arXiv · 2501.02868

The importance of shear on the collective charge transport in CDWs revealed by an XFEL source

David Le Bolloc'h·Ewen Bellec·Darine Ghoneim·Antoine Gallo-Frantz·Pawel Wzietek·Luc Ortega·Anders Madsen·Pierre Monceau·Mathieu Chollet·Isabel Gonzales-Vallejo·Vincent. L. R. Jacques·Aleksandr Sinchenko
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Abstract

Charge transport in materials has an impact on a wide range of devices based on semiconductor, battery or superconductor technology. Charge transport in sliding Charge Density Waves (CDW) differs from all others in that the atomic lattice is directly involved in the transport process. To obtain an overall picture of the structural changes associated to the collective transport, the large coherent X-ray beam generated by an X-ray free-electron laser (XFEL) source was used. The CDW phase can be retrieved over the entire sample from diffracted intensities using a genetic algorithm. For currents below threshold, increasing shear deformation is observed in the central part of the sample while longitudinal deformation appears above threshold when shear relaxes. Shear thus precedes longitudinal deformation, with relaxation of one leading to the appearance of the other. Moreover, strain accumulates on surface steps in the sliding regime, demonstrating the strong pinning character of these surface discontinuities. The sliding process of nanometric CDW is based on an impressive spatial coherence involving the macroscopic sample dimensions.

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David Le Bolloc'h, Ewen Bellec, Darine Ghoneim, Antoine Gallo-Frantz, Pawel Wzietek, Luc Ortega, Anders Madsen, Pierre Monceau, Mathieu Chollet, Isabel Gonzales-Vallejo, Vincent. L. R. Jacques, Aleksandr Sinchenko. 2025-01-06. The importance of shear on the collective charge transport in CDWs revealed by an XFEL source. https://doi.org/10.1126/sciadv.adr6034

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