Phenomenological model of crack patterns in thin colloidal films undergoing desiccation

Yuri Yu. Tarasevich; Andrei V. Eserkepov; Irina V. Vodolazskaya; Avik P. Chatterjee

doi:10.1103/physreve.111.045404

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arXiv · 2501.07303

Phenomenological model of crack patterns in thin colloidal films undergoing desiccation

Yuri Yu. Tarasevich·Andrei V. Eserkepov·Irina V. Vodolazskaya·Avik P. Chatterjee

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Abstract

A number of geometric and topological properties of samples of crack-template based conductive films are examined to assess the degree to which Voronoi diagrams can successfully model structure and conductivity in such networks. Our analysis suggests that although Poisson--Voronoi diagrams are only partially successful in modeling structural features of real-world crack patterns formed in films undergoing desiccation, such diagrams can nevertheless be useful in situations where topological characteristics are more important than geometric ones. A phenomenological model is proposed that is more accurate at capturing features of the real-world crack patterns.

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Yuri Yu. Tarasevich, Andrei V. Eserkepov, Irina V. Vodolazskaya, Avik P. Chatterjee. 2025-01-13. Phenomenological model of crack patterns in thin colloidal films undergoing desiccation. https://doi.org/10.1103/physreve.111.045404

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