Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases

Chen Wang; Shaoshan Wang; Chuan Guo; Chengjian Yu; Qi Fu; Xiaopeng Xie; Changxi Zheng

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arXiv · 2503.00460

Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases

Chen Wang·Shaoshan Wang·Chuan Guo·Chengjian Yu·Qi Fu·Xiaopeng Xie·Changxi Zheng

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Abstract

Quantum materials exhibit phases such as superconductivity at low temperatures, yet imaging their phase transition dynamics with high spatial resolution remains challenging due to conventional tools' limitations - scanning tunneling microscopy offers static snapshots, while transmission electron microscopy lacks band sensitivity. Photoemission electron microscopy (PEEM) can resolve band structures in real/reciprocal spaces rapidly, but suffering from insufficient resolution for (near)atomic-scale quantum physics due to the unstable cooling designs. Here, we developed cryogen-free low-temperature PEEM (CFLT-PEEM) achieving 21.1 K stably. CFLT-PEEM attains a record-breaking resolution of 4.48 nm without aberration correction, enabling direct visualization of surface-state distribution characteristics along individual atomic steps. The advancement lies in narrowing the segment of band structures for imaging down to 160 meV, which minimizes the chromatic aberration of PEEM. CFLT-PEEM enables rapid, nondestructive high-resolution imaging of cryogenic electronic structures, positioning it as a powerful tool for physics and beyond.

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Chen Wang, Shaoshan Wang, Chuan Guo, Chengjian Yu, Qi Fu, Xiaopeng Xie, Changxi Zheng. 2025-03-01. Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases. https://arxiv.org/abs/2503.00460

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