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arXiv · 2509.11037

Planar Ballistic Electron Emission Spectroscopy for Single-Shot Probing of Energy Barrier Inhomogeneity at Junction Interface

Jiwan Kim·Jaehyeong Jo·Jungjae Park·Hyunjae Park·Eunseok Hyun·Jisang Lee·Sejin Oh·Kibog Park
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Abstract

We propose an experimental methodology for probing the energy barrier inhomogeneity at the metal/semiconductor interface without the need for time-consuming microscopic survey. It is based on the known statistical nature of the interfacial energy barrier and the use of planar tunnel junction as an array of parallelly-connected ballistic electron emission microscopy (BEEM) tips. In order to analyze a lump of local BEEM signals, we incorporate the Tung model into the Bell-Kaiser theory. To validate our theoretical strategies, we investigate the interfacial energy barrier inhomogeneity of Pt/4H-SiC(0001) junction as a model system.

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Jiwan Kim, Jaehyeong Jo, Jungjae Park, Hyunjae Park, Eunseok Hyun, Jisang Lee, Sejin Oh, Kibog Park. 2025-09-14. Planar Ballistic Electron Emission Spectroscopy for Single-Shot Probing of Energy Barrier Inhomogeneity at Junction Interface. https://arxiv.org/abs/2509.11037

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