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arXiv · 2510.17936

XDXD: End-to-end crystal structure determination with low resolution X-ray diffraction

Abstract

Determining crystal structures from X-ray diffraction data is fundamental across diverse scientific fields, yet remains a significant challenge when data is limited to low resolution. While recent deep learning models have made breakthroughs in solving the crystallographic phase problem, the resulting low-resolution electron density maps are often ambiguous and difficult to interpret. To overcome this critical bottleneck, we introduce XDXD, to our knowledge, the first end-to-end deep learning framework to determine a complete atomic model directly from low-resolution single-crystal X-ray diffraction data. Our diffusion-based generative model bypasses the need for manual map interpretation, producing chemically plausible crystal structures conditioned on the diffraction pattern. We demonstrate that XDXD achieves a 70.4\% match rate for structures with data limited to 2.0~\AA{} resolution, with a root-mean-square error (RMSE) below 0.05. Evaluated on a benchmark of 24,000 experimental structures, our model proves to be robust and accurate. Furthermore, a case study on small peptides highlights the model's potential for extension to more complex systems, paving the way for automated structure solution in previously intractable cases.

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Jiale Zhao, Cong Liu, Yuxuan Zhang, Chengyue Gong, Zhenyi Zhang, Shifeng Jin, Zhenyu Liu. 2025-10-20. XDXD: End-to-end crystal structure determination with low resolution X-ray diffraction. https://arxiv.org/abs/2510.17936

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