arXiv · 2511.08264
Effect of W in Cu-Zr-W thin films: Molecular dynamics simulations and experimental verification
Abstract
We investigate the effects of W incorporation into Cu-Zr thin film metallic glasses using molecular dynamics (MD) simulations combined with magnetron sputtering. All studies are carried out in the whole range of W concentrations (0 to 100 at. %) and the MD studies also in a wide range of incident energies (1 to 500 eV) and deposition angles (0 to 60{\deg}). Calculated X-ray diffractograms, packing factor, short-range order (bonding fractions and coordination numbers), medium-range order (network ring and common neighbor statistics) and stress are correlated with measured X-ray diffractograms and properties (hardness, hardness/Young's modulus ratio and elastic recovery). The simulations explain the experimental results at the atomic level and provide a lot of information that is not available experimentally. Special attention is paid to non-monotonic dependencies on the elemental composition and incident energy. Collectively, the results explain the role of W in modifying the structure and improving the mechanical performance of Cu-Zr metallic glasses, predict optimum compositions which maximize some of the mechanical properties, and contribute to the development of advanced materials for various applications.
Explore related subjects
Keep this discovery
Hassan Ataalite, Jiri Houska, Deepika Thakur, Michaela Cervena, Petr Zeman. 2025-11-11. Effect of W in Cu-Zr-W thin films: Molecular dynamics simulations and experimental verification. https://arxiv.org/abs/2511.08264
Cite the original work for its findings. Save a collection to share your selection of sources.