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arXiv · 2604.22486

Laplace Transform driven Stein-type Goodness-of-fit Tests for Pareto Distribution

Deepesh Bhati·Sakshi Khandelwal
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Abstract

The Pareto distribution plays a crucial role in various disciplines, necessitating robust goodness-of-fit tests for its validation. This article introduces a novel tests based on Stein's characterization and the Laplace transform, offering a fresh perspective on model assessment. We establish the asymptotic properties of the proposed test and evaluate its empirical performance against existing methods in terms of size and power. Our findings demonstrate that the new test often outperforms or performs comparably to established tests. In addition, real data applications illustrate its practical utility.

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Deepesh Bhati, Sakshi Khandelwal. 2026-04-24. Laplace Transform driven Stein-type Goodness-of-fit Tests for Pareto Distribution. https://arxiv.org/abs/2604.22486

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