arXiv · 2604.24701
Profiling Resilient to Change in Probe Position
Abstract
Side Channel Analysis (SCA) relaxes the black-box assumption of conventional cryptanalysis by incorporating physical measurements acquired during cryptographic operations. Electro-magnetic (EM) emissions of a chip during computations often provide a very valuable source of side channel leakage. During the evaluation of a chip for electro-magnetic side channel emissions one needs to position an electro-magnetic probe in an advantageous position relative to the chip. Previous literature focused on hot-spot finding and to a lower extend repositioning. Trace augmentations have been considered to aid portability of profiling using one physical device and attacking another device. This paper focuses on training a single neural network using traces from multiple EM probe positions to detect leakage from a larger area over the attacked device. We provide dual evaluation of EM traces - from two completely independent labs - profiling on data from one lab and attacking traces from the other lab.
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Elie Bursztein, Michael Gruber, Karel Král, Jean-Michel Picod, Matthias Probst, Georg Sigl. 2026-04-27. Profiling Resilient to Change in Probe Position. https://arxiv.org/abs/2604.24701
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