Optimal sequential tests yield log-optimal e-processes

Ashwin Ram; Aaditya Ramdas

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arXiv · 2605.12720

Optimal sequential tests yield log-optimal e-processes

Ashwin Ram·Aaditya Ramdas

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Abstract

It has been recently shown that e-processes are sufficient for sequential testing in the following sense: every level-$\alpha$ sequential test can be obtained by thresholding an e-process at $1/\alpha$. However, in the above result, neither does the test have to be asymptotically optimal (in terms of stopping times) nor does the e-process have to be asymptotically log-optimal. It has separately been shown that asymptotically log-optimal e-processes yield asymptotically optimal sequential tests. In this paper, we prove the converse, arguably completing the story: it is possible to aggregate asymptotically optimal sequential tests into asymptotically log-optimal e-processes. This is accomplished by using a new class of WAIT e-processes: those that are Weighted Aggregates of Indicators of stopping Times that begin at zero, are nondecreasing and increase to infinity under the alternative at the optimal rate. Importantly, the paper discusses several nuances in the varied definitions of asymptotic (log-)optimality.

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BibTeX RIS

Ashwin Ram, Aaditya Ramdas. 2026-05-12. Optimal sequential tests yield log-optimal e-processes. https://arxiv.org/abs/2605.12720

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