Near-Field Characterisation of Guided Modes in WS2 Nanobeams and Quasi-Bulk Crystals

Abstract

The exceptionally high in-plane refractive index, low sub-bandgap absorption, and strong optical anisotropy of WS2 make it a promising material platform for next-generation integrated circuits for nanophotonics. Its layered van der Waals structure further enables heterogeneous integration with silicon photonics and emerging two-dimensional optoelectronic materials. However, despite increasing interest in the waveguiding properties of WS2, experimental studies of wavelength-dependent modal confinement and attenuation remain limited. Additionally, though the extinction coefficient of WS2 is expected to be near-negligible beneath the bandgap, reported values span orders of magnitude, leading to large uncertainty in predicted modal decay lengths and wafer-scale integration feasibility. To resolve these ambiguities we perform hyperspectral cavity-enhanced imaging, determining high-resolution upper and lower bounds on the extinction coefficient of WS2 within the visible-NIR edge. We further employ scattering-type scanning near-field optical microscopy (s-SNOM) to probe TE0, TM0, and higher-order modes in both quasi-bulk and nanobeam WS2 waveguides across the 800-1400 nm spectral range, enabling identification of mode-specific trends in wavevector dispersion and loss. This work simultaneously assesses s-SNOM as a probe of waveguide performance, and we find that while absolute loss values depend on measurement geometry, s-SNOM reliably captures relative modal trends and provides upper bounds on propagation loss, supporting its use as a diagnostic tool for anisotropic waveguides. We further identify significant artefacts in nanobeam measurements arising from transverse interference and spatial sampling effects when the structure size approaches the excitation wavelength, which can shift extracted effective indices by up to 0.25.