arXiv · 2608.06313
An Analysis of the Accuracy of the Added Length De-Embedding Methods for Coaxial to Waveguide Adapters in the X-Band
Abstract
This paper assesses the accuracy of the "added length method" (also known as port extension or channel offset) for de-embedding coaxial-to-waveguide transitions in the X-band, comparing it to full waveguide calibration on both Keysight and Rohde & Schwarz VNAs. The study examines the trade-offs between cost and measurement accuracy, highlighting the feasibility of using these mathematical correction techniques in the absence of dedicated waveguide calibration kits or full S-parameter characterizations of the transitions. The analysis concluded that when using coaxial-to-waveguide transitions the added length method produces accurate results for transmission measurements only.
Explore related subjects
Keep this discovery
Eric Bauman, James DePoy, Sterling Light, Arya Menon, Marco Iskander. 2026-08-06. An Analysis of the Accuracy of the Added Length De-Embedding Methods for Coaxial to Waveguide Adapters in the X-Band. https://arxiv.org/abs/2608.06313
Cite the original work for its findings. Save a collection to share your selection of sources.