Ultralow p-type contact resistance for ultra-nanoscaled 2D-materials transistors

Abstract

High contact resistance is one of the main bottlenecks for practical two-dimensional (2D) materials transistors, especially for p-type transistors and future 2D ultra-nanoscaled (sub-10 nm) FETs (PMOS + CMOS). We develop self-consistent contact resistance models for metal-2D semiconductor-metal devices to capture the essential interface physics for both vertical and edge configurations. Our calculations have been verified with various recent experiments of p-type and n-type contacts. For a given set of materials, the model determines the scaling of contact resistance over a wide range of device parameters including channel length (100s nm down to sub-10 nm), doping and mobility of the 2D materials, contact length of the electrodes, and applied voltages. These results identify the key factors in order to reduce the contact resistance for p-type 2D semiconductor WSe$_2$ towards the sub-10 nm channel length scale that are readily to be realized by future experiments. It is found that the effect of source-limited current saturation is the key challenge for down scaling 2D FET to sub-10 nm channel length. Two topological semi-metals as potential electrodes are proposed for 2D p-type semiconducting WSe$_2$ with our predicted contact resistance $R_c<$ 100 $\Omega \; {\rm \mu m}$ approaching the quantum limit. Our model is also verified with the computational expensive full quantum atomistic model that is currently limited to a few nm scale.