Thickness-Driven Superconductor-Insulator Transition in (Cu,C)-1234 and Proximity-Induced Superconductivity Recovery in (Cu,C)-1234/YBCO Heterostructure

Abstract

Superconducting proximity effect and related thickness-driven property evolution remain an important issue in understanding high temperature superconductors. Among proximity systems, superconductor-superconductor (S-S') is special for the existence of intrinsic superconductivity in both materials. Such platform allows the different superconducting orders to compete, couple and reconstruct at the interface. In this paper, (Cu,C)-1234/YBCO heterostructure grown on LAO (001) with fixed thickness of bottom YBCO layer as 150 nm and varied thickness of top (Cu,C)-1234 layer as 188nm, 87 nm, 18nm and estimated 1.2 nm were fabricated and component films were preserved. Electrical transport characterization indicated that as the thickness decrease the (Cu,C)-1234 film degrades and underwent the superconductor-insulator transition (SIT) from thicker to less than 18 nm. In contrast, superconductivity is re-established in transport measurements when the insulating (Cu,C)-1234 layer is coupled to superconducting YBCO As the (Cu,C)-1234 thickness is further reduced to approximately 1.2 nm, the recovered superconductivity is strongly suppressed. The observed thickness dependence is consistent with a scenario in which interfacial coupling restores superconductivity over a finite thickness range before increasing disorder and dimensional confinement dominate in the two-dimensional limit. This work establishes a promising platform for investigating interfacial coupling between cuprate superconductors and provides new insight into the superconducting proximity effect in high-temperature superconducting heterostructures.