arXiv · 2610.09749
Automated reduction of fault-tolerant circuits
Abstract
We present an automated method for reducing fault-tolerant circuits through fault-equivalent rewrites. Starting from a known fault-tolerant circuit, the search applies non-reducing enabling rules to expose Bell-pair reductions, each of which removes an ancilla preparation and a CNOT gate. Because every search transition preserves fault equivalence, the resulting circuits inherit the fault-tolerance properties of the input circuit. Candidate circuits are evaluated using circuit-level Monte Carlo simulation. For Shor-style syndrome extraction with the $[[7,1,3]]$ code, our method reduces one syndrome-measurement round from 30 to 18 ancilla preparations and from 54 to 42 CNOT gates. At a physical two-qubit error rate of $p = 10^{-3}$, the optimized circuit lowers the logical error rate by approximately 21% for both logical basis states. The reduction ranges from 13% to 23% over a range of $p$ spanning two orders of magnitude. We also apply the method to Steane-based dynamic syndrome extraction constructed from Goto's verified logical-$\lvert 0 \rangle$ preparation, in which the verification qubit serves as a flag. The search selects a circuit using four ancillas and 14 CNOT gates, matching the resource counts of the previous design but with an improved CNOT depth. Under depolarizing idle noise at $3p/10$ the selected circuit lowers the logical error rate by approximately 15% for both logical basis states, and by approximately $10%$ at $p/10$. These results demonstrate that automated fault-equivalent rewriting can identify circuits with lower resource costs or improved logical performance without separately verifying the fault tolerance of every candidate.
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Hyeongjun Jeon, Jeonghoon Lee, Taehyun Kim. 2026-10-07. Automated reduction of fault-tolerant circuits. https://arxiv.org/abs/2610.09749
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