Coherent Electronic Lensing in Proximitized Graphene

Abstract

Spatially resolved control of coherent electron transport offers a route to understanding and engineering interference phenomena in hybrid superconducting devices. Here, we use Scanning Gate Microscopy (SGM) to investigate Fabry-Pérot (FP) interference in the n-p-n cavity of a ballistic graphene Josephson junction. Spatial maps of the superconducting switching current and normal-state conductance reveal circular interference fringes arising from two distinct effects of the SGM tip potential. A global shift of the Fermi wave vector modulates the FP resonances of the cavity, while a local perturbation produces additional oscillations that persist at fixed Fermi wave vector as the tip bias is varied. An analytical model identifies the origin of this local response with coherent electron lensing, in which the tip modifies the phase accumulated along interfering trajectories. The measured fringe patterns in the switching current indicate that this mechanism affects superconducting transport, consistent with tip-induced shifts of the resonance conditions for Andreev bound states. These results establish SGM as a tunable local lens for controlling interference in superconducting ballistic graphene devices.