Chemical abundances of the Galactic H II region NGC 3576 derived from VLT echelle spectrophotometry

Abstract

We present echelle spectrophotometry of the Galactic H II region NGC 3576. The data have been taken with the VLT UVES echelle spectrograph in the 3100 to 10400 angstroms range. We have measured the intensities of 458 emission lines, 344 are permitted lines of H0, He0, C+, N0, N+, N++, O0, O+, Ne+, S++, Si0, Si+, Ar0 and Ar+; some of them are produced by recombination and others mainly by fluorescence. Electron temperatures and densities have been determined using different continuum and line intensity ratios. We have derived He+, C++, O+, O++ and Ne++ ionic abundances from pure recombination lines. We have also derived abundances from collisionally excited lines for a large number of ions of different elements. Remarkably consistent estimations of t2 have been obtained by comparing Balmer and Paschen to [O III] temperatures, and O++ and Ne++ ionic abundances obtained from collisionally excited and recombination lines. The chemical composition of NGC 3576 is compared with those of other Galactic H II regions and with the one from the Sun. A first approach to the gas-phase Galactic radial abundance gradient of C as well as of the C/O ratio has been made.