Simple model for the linear temperature dependence of the electrical resistivity of layered cuprates

Todor M. Mishonov; Mihail T. Mishonov

doi:10.1016/s0378-4371(99)00568-3

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Simple model for the linear temperature dependence of the electrical resistivity of layered cuprates

Todor M. Mishonov·Mihail T. Mishonov

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Abstract

The thermal fluctuations of the electric field between the CuO_2 planes of layered cuprates are considered as an origin of the electrical resistivity. The model evaluation employs a set of separate plane capacitors each having area equal to the squared in-plane lattice constant a_0^2. It is shown that the scattering of charge carriers by the fluctuation of electric charge in the conducting CuO_2 planes gives rise to the in-plane electrical resistivity rho_ab. Such a mechanism can be viewed as an analog of the Rayleigh's blue-sky law---the charge carriers are scattered by thermal fluctuations of electron density.

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Todor M. Mishonov, Mihail T. Mishonov. 2000-01-04. Simple model for the linear temperature dependence of the electrical resistivity of layered cuprates. https://doi.org/10.1016/s0378-4371(99)00568-3

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