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Nonexponential Relaxation of Magnetization at the Resonant Tunneling Point under a Fluctuating Random Noise

Seiji Miyashita·Keiji Saito
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Abstract

Nonexponential relaxation of magnetization at resonant tunneling points of nanoscale molecular magnets is interpreted to be an effect of fluctuating random field around the applied field. We demonstrate such relaxation in Langevin equation analysis and clarify how the initial relaxation (square-root time) changes to the exponential decay. The scaling properties of the relaxation are also discussed.

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Seiji Miyashita, Keiji Saito. 2000-05-01. Nonexponential Relaxation of Magnetization at the Resonant Tunneling Point under a Fluctuating Random Noise. https://doi.org/10.1143/jpsj.70.3238

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