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Geometry dependent dephasing in small metallic wires

D. Natelson·R. L. Willett·K. W. West·L. N. Pfeiffer
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Abstract

Temperature dependent weak localization is measured in metallic nanowires in a previously unexplored size regime down to width $w=5$ nm. The dephasing time, $τ_ϕ$, shows a low temperature $T$ dependence close to quasi-1D theoretical expectations ($τ_ϕ \sim T^{-2/3}$) in the narrowest wires, but exhibits a relative saturation as $T \to 0$ for wide samples of the same material, as observed previously. As only sample geometry is varied to exhibit both suppression and divergence of $τ_ϕ$, this finding provides a new constraint on models of dephasing phenomena.

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D. Natelson, R. L. Willett, K. W. West, L. N. Pfeiffer. 2000-06-20. Geometry dependent dephasing in small metallic wires. https://doi.org/10.1103/physrevlett.86.1821

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