arXiv · cond-mat/0009369
Kinetics of exciton photoluminescence in type-II semiconductor superlattices
Abstract
The exciton decay rate at a rough interface in type-II semiconductor superlattices is investigated. It is shown that the possibility of recombination of indirect excitons at a plane interface essentially affects kinetics of the exciton photoluminescence at a rough interface. This happens because of strong correlation between the exciton recombination at the plane interface and at the roughness. Expressions that relate the parameters of the luminescence kinetics with statistical characteristics of the rough interface are obtained. The mean height and length of roughnesses in GaAs/AlAs superlattices are estimated from the experimental data.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
L. S. Braginsky, M. Yu. Zaharov, A. M. Gilinsky, V. V. Preobrazhenskii, M. A. Putyato, K. S. Zhuravlev. 2000-09-24. Kinetics of exciton photoluminescence in type-II semiconductor superlattices. https://doi.org/10.1103/physrevb.63.195305
Cite the original work for its findings. Save a collection to share your selection of sources.