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Single-Electron Measurements with a Micromechanical Resonator

R. E. S. Polkinghorne·G. J. Milburn
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Abstract

A mechanical electroscope based on a change in the resonant frequency of a cantilever one micron in size in the presence of charge has recently been fabricated. We derive the decoherence rate of a charge superposition during measurement with such a device using a master equation theory adapted from quantum optics. We also investigate the information produced by such a measurement, using a quantum trajectory approach. Such instruments could be used in mesoscopic electronic systems, and future solid-state quantum computers, so it is useful to know how they behave when used to measure quantum superpositions of charge.

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R. E. S. Polkinghorne, G. J. Milburn. 2001-10-16. Single-Electron Measurements with a Micromechanical Resonator. https://doi.org/10.1103/physreva.64.042318

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